Hilbert transform-based envelope substitution method for non-uniform sampling signal correction in white-light interferometry
Xin Lei, Zhongming Yang, Jiantai Dou, Zhaojun Liu, Zhishan Gao, Xingyu Zhang
Abstract
White-light scanning interferometry is an effective and widely used technology for measuring the microscopic three-dimensional morphology of an object. However, it is easily affected by external disturbances and appears to have a non-uniform sampling problem, which reduces the measurement accuracy. In this study, an effective correction algorithm is presented, in which a Hilbert transform and a correlation analysis of the white light interference envelope curves, as well as the simulated ideal interference signal envelope, are employed for a robust and high precision signal correction. In addition, the proposed method is at least 4 times as accurate as a traditional method and achieves a high repeatability, which is analyzed through a simulation and contrast experiments.