Device-Independent Certification of Maximal Randomness from Pure Entangled Two-Qutrit States Using Non-Projective Measurements
Jakub J. Borkała, Chellasamy Jebarathinam, Shubhayan Sarkar, Remigiusz Augusiak
Abstract
While it has recently been demonstrated how to certify the maximal amount of randomness from any pure two-qubit entangled state in a device-independent way, the problem of optimal randomness certification from entangled states of higher local dimension remains open. Here we introduce a method for device-independent certification of the maximal possible amount of 2log23 random bits using pure bipartite entangled two-qutrit states and extremal nine-outcome general non-projective measurements. To this aim, we exploit a device-independent method for certification of the full Weyl-Heisenberg basis in three-dimensional Hilbert spaces together with a one-sided device-independent method for certification of two-qutrit partially entangled states.