Litcius/Paper detail

TCAD Temperature Analysis of Gate Stack Gate All Around (GS-GAA) FinFET for Improved RF and Wireless Performance

Bhavya Kumar, Rishu Chaujar

2021Silicon52 citationsDOI

Topics & Concepts

Materials scienceTransconductanceOptoelectronicsLinearityRadio frequencyThreshold voltageGain–bandwidth productVoltageTransistorElectrical engineeringAmplifierCMOSOperational amplifierEngineeringSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignFerroelectric and Negative Capacitance Devices