Degradation by sidewall recombination centers in GaN blue micro-LEDs at diameters<30 µm
In‐Hwan Lee, Taehwan Kim, A. Y. Polyakov, А. В. Черных, М. Л. Скориков, E. B. Yakimov, L. A. Alexanyan, Ivan Shchemerov, A.A. Vasil'ev, S. J. Pearton
Topics & Concepts
Light-emitting diodeOptoelectronicsMaterials scienceDiodePhotoluminescenceDeep-level transient spectroscopyDiffusion capacitanceCapacitanceChemistrySiliconElectrodePhysical chemistryGaN-based semiconductor devices and materialsSemiconductor Quantum Structures and DevicesPhotocathodes and Microchannel Plates