Efficient Yield Estimation of Microwave Structures Using Mesh Deformation-Incorporated Space Mapping Surrogates
Jianan Zhang, Feng Feng, Jing Jin, Qi‐Jun Zhang
Abstract
Accurateyield estimation is of particular importance in microwave component design due to the presence of manufacturing tolerances. Coarse- and fine-mesh space mapping (SM) methodology has been regarded as a powerful tool for facilitating electromagnetic (EM)-based yield estimation, especially when equivalent circuit coarse models are not available. This letter proposes a novel EM-based yield estimation technique using mesh deformation-incorporated coarse- and fine-mesh SM. Through the incorporation of mesh deformation into coarse-mesh simulation, both the coarse-mesh EM responses and the coarse-mesh EM sensitivities change continuously as geometrical parameters change. This allows the proposed technique to use a coarser mesh in building the SM surrogate than the conventional SM technique, thereby accelerating the overall EM-based yield estimation process. The proposed yield estimation technique is demonstrated through two microwave examples.