Optimization of Tests for Managing Silicon Defects in Data Centers
David Lerner, Benson Inkley, Shubhada Sahasrabudhe, Ethan Hansen, Luis D. Rojas Munoz, Arjan van de Ven
Abstract
The Intel Data Center Diagnostics Tool (DCDIAGS) is a suite of tests for screening defects that may cause silent data errors. We analyzed individual DCDIAGS tests to understand their characteristics, the defects that they detect, and how to best optimize the tests for use in manufacturing and in-field screening.
Topics & Concepts
SuiteComputer scienceField (mathematics)Reliability engineeringData centerSoftware bugSoftwareEngineeringOperating systemMathematicsHistoryArchaeologyPure mathematicsRadiation Effects in ElectronicsVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure Analysis