Litcius/Paper detail

High-resolution angle-resolved photoemission spectroscopy and microscopy

Hideaki Iwasawa

2020Electronic Structure46 citationsDOIOpen Access PDF

Abstract

Abstract This review outlines fundamental principles, instrumentation, and capabilities of angle-resolved photoemission spectroscopy (ARPES) and microscopy. We will present how high-resolution ARPES enables to investigate fine structures of electronic band dispersions, Fermi surfaces, gap structures, and many-body interactions, and how angle-resolved photoemission microscopy (spatially-resolved ARPES) utilizing micro/nano-focused light allows to extract spatially localized electronic information at small dimensions. This work is focused on specific results obtained by the author from strongly correlated copper and ruthenium oxides, to help readers to understand consistently how these techniques can provide essential electronic information of materials, which can, in principle, apply to a wide variety of systems.

Topics & Concepts

Angle-resolved photoemission spectroscopyPhotoemission spectroscopyMicroscopyInverse photoemission spectroscopyMaterials scienceElectronic structureSpectroscopyFermi levelResolution (logic)Photoemission electron microscopyCondensed matter physicsX-ray photoelectron spectroscopyNanotechnologyOpticsPhysicsElectron microscopeNuclear magnetic resonanceComputer scienceQuantum mechanicsElectronArtificial intelligenceElectronic and Structural Properties of OxidesPhysics of Superconductivity and MagnetismSurface and Thin Film Phenomena