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Characteristic and Robustness of Trench Floating Limiting Rings for 4H-SiC Junction Barrier Schottky Rectifiers

Hao Yuan, Yancong Liu, Yanjing He, Yanfei Hu, Tingsong Zhang, Xiao-Yan Tang, Qingwen Song, Yimen Zhang, Yuming Zhang, Xiaoning He, Qingyou Qian, Xiao Li

2020IEEE Electron Device Letters20 citationsDOI

Abstract

In this letter, planar floating limiting rings (FLRs) and trench FLRs with different trench depths for the 4H-SiC junction barrier Schottky (JBS) rectifiers are analyzed and compared with simulations and experiments. Compared with the planar FLRs, the experimental results present that the first ring spacing window that termination efficiency exceeds 80% of the parallel plane breakdown voltage (BV) can be widened and termination area can be reduced at the same BV by adopting the trench FLRs. The simulations also indicate that there is an optimal trench depth for the trench FLRs and a smaller sidewall angle can achieve better device performance. Additionally, the repetitive avalanche current stress measurements imply that the trench FLRs has better robustness regarding the BV shift, achieving better device reliability.

Topics & Concepts

TrenchPlanarRobustness (evolution)LimitingSchottky diodeMathematicsVoltageShallow trench isolationOptoelectronicsMaterials scienceElectrical engineeringComputer scienceEngineeringDiodeComposite materialChemistryLayer (electronics)GeneMechanical engineeringComputer graphics (images)BiochemistrySilicon Carbide Semiconductor TechnologiesSemiconductor materials and interfacesSilicon and Solar Cell Technologies
Characteristic and Robustness of Trench Floating Limiting Rings for 4H-SiC Junction Barrier Schottky Rectifiers | Litcius