Numerical analysis of dopant concentration in 200 mm (8 inch) floating zone silicon
Xuefeng Han, Xin Liu, Satoshi Nakano, Koichi Kakimoto
Topics & Concepts
DopantSiliconElectrical resistivity and conductivityNatural convectionDiffusionMechanicsMaterials scienceConvectionFlow (mathematics)Rotation (mathematics)ChemistryMineralogyCondensed matter physicsThermodynamicsAnalytical Chemistry (journal)DopingPhysicsGeometryMetallurgyOptoelectronicsMathematicsQuantum mechanicsChromatographySolidification and crystal growth phenomenaSilicon and Solar Cell TechnologiesFluid Dynamics and Thin Films