Atomic Force Microscopy-Based Nanoscale Infrared Techniques for Catalysis
Jian Li, Jing Liang, Mu-Hao Lan, Xing‐Hua Xia
Abstract
Atomic force microscopy (AFM)-based nanoscale infrared (nano-IR) techniques have found extensive application in the fields of chemistry, physics, and materials science, enabling the visualization of nanoscale features that surpass the optical diffraction limit. More recently, tentative investigations have been conducted into the use of these techniques in the field of catalysis, particularly in studying interfacial processes involving molecular monolayer samples. IR nanoimaging and nanospectroscopy offer unique perspectives on catalytic processes. Considering the specific characteristics of catalytic processes, this Perspective highlights the need for and reviews the current status of AFM-based nano-IR techniques for catalysis investigations, which aims to contribute to a deeper understanding of the nanoscale mechanisms underlying the catalytic processes.