Super-resolved Raman microscopy using random structured light illumination: Concept and feasibility
Hongki Lee, Hajun Yoo, Gwiyeong Moon, Kar‐Ann Toh, Kentaro Mochizuki, Katsumasa Fujita, Donghyun Kim
Abstract
In this article, we report the use of randomly structured light illumination for chemical imaging of molecular distribution based on Raman microscopy with improved image resolution. Random structured basis images generated from temporal and spectral characteristics of the measured Raman signatures were superposed to perform structured illumination microscopy (SIM) with the blind-SIM algorithm. For experimental validation, Raman signatures corresponding to Rhodamine 6G (R6G) in the waveband of 730–760 nm and Raman shift in the range of 1096–1634 cm−1 were extracted and reconstructed to build images of R6G. The results confirm improved image resolution using the concept and hints at super-resolution by almost twice better than the diffraction-limit.