Zinc selenide analyzed by XPS
Jeffrey R. Shallenberger, Niklas Hellgren
Abstract
Zinc selenide (ZnSe) was analyzed using x-ray photoelectron spectroscopy (XPS). A small notched rod was fractured in the XPS vacuum system at 6 × 10−4 Pa to create an oxygen-free surface for analysis. Spectral regions for Zn 2p, Zn 3d, Zn LMM, O 1s, C 1s, Se 3d, Se 3p, and Se LMM and valence band regions were acquired. The presence of carbon could not be confirmed due to interferences between C 1s and Se LMM and between C KLL and Zn 3s. It is believed that any carbon present is very low.
Topics & Concepts
X-ray photoelectron spectroscopyZinc selenideSelenideZincCarbon fibersMaterials scienceAnalytical Chemistry (journal)Valence bandValence (chemistry)OxygenChemistrySeleniumBand gapMetallurgyEnvironmental chemistryNuclear magnetic resonancePhysicsOptoelectronicsOrganic chemistryComposite materialComposite numberChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesCopper-based nanomaterials and applications