Litcius/Paper detail

Predicting aging of IGBT solder layer using saturation voltage approach with CPO-SVR data modeling

Xiaoyu An, Zhaoyuan Huang, Zhifeng Dou, Falong Lu, Qian Wang

2024Microelectronics Reliability13 citationsDOI

Topics & Concepts

Insulated-gate bipolar transistorSaturation currentMaterials scienceSolderingSaturation (graph theory)Layer (electronics)VoltageElectronic engineeringOptoelectronicsReliability engineeringComposite materialElectrical engineeringEngineeringMathematicsCombinatoricsSilicon Carbide Semiconductor TechnologiesSilicon and Solar Cell TechnologiesAdvancements in Semiconductor Devices and Circuit Design