Analog/Mixed-Signal Circuit Testing Technologies in IoT Era
Haruo Kobayashi, Anna Kuwana, Jianglin Wei, Yujie Zhao, Shogo Katayama, Tran Minh Tri, Manato Hirai, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Abstract
This paper introduces our production testing research results for analog and mixed-signal SoC in IoT era, such as operational amplifier, ADC, sampling circuit, timing related testing technologies. Notice that production testing and measurement / characterization for ICs are similar but different, and this paper introduces the former. The analog / mixed-signal testing plays a very important role in achieving both reliability and low cost for IoT and automotive systems. It also is a big technological challenge because there is no general method, but it requires state-of-the-art combination and optimization of a wide variety of technologies including circuit and system design as well as signal processing, control and measurement algorithms. Their overview including future technology challenges is described.