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Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels

Seyoung Park, Jaeyeon Jang, Chang Ouk Kim

2020Journal of Intelligent Manufacturing41 citationsDOI

Topics & Concepts

Discriminative modelArtificial intelligencePattern recognition (psychology)Computer scienceClass (philosophy)Convolutional neural networkFeature (linguistics)Cluster analysisBinData miningMachine learningAlgorithmPhilosophyLinguisticsIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques
Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels | Litcius