Analytical modeling of a dual-material graded-channel cylindrical gate-all-around FET to minimize the short-channel effects
Praveen Kumar Mudidhe, Bheema Rao Nistala
Topics & Concepts
Threshold voltageMaterials scienceChannel (broadcasting)Drain-induced barrier loweringBoundary value problemVoltageField-effect transistorCylinderPoisson's equationOptoelectronicsTransistorElectrical engineeringMathematical analysisGeometryMathematicsEngineeringAdvancements in Semiconductor Devices and Circuit DesignSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devices