Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process
Daen Jannis, Abner Velazco, Armand Béché, Johan Verbeeck
Topics & Concepts
DissipationSample (material)Beam (structure)DiffusionComputer scienceProcess (computing)Function (biology)OpticsStatistical physicsPhysicsThermodynamicsOperating systemBiologyEvolutionary biologyElectron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and ApplicationsX-ray Spectroscopy and Fluorescence Analysis