Reliability estimation from lifetime testing data and degradation testing data with measurement error based on evidential variable and Wiener process
Di Liu, Shaoping Wang
Topics & Concepts
Reliability (semiconductor)Wiener processProcess (computing)Reliability engineeringVariable (mathematics)Computer scienceObservational errorEvidential reasoning approachData miningStatisticsEngineeringMathematicsDecision support systemMathematical analysisOperating systemBusiness decision mappingQuantum mechanicsPower (physics)PhysicsReliability and Maintenance OptimizationProbabilistic and Robust Engineering DesignStatistical Distribution Estimation and Applications