Experimental demonstration of novel beam characterization using a polarizable X-band transverse deflection structure
Barbara Marchetti, Alexej Grudiev, P. Craievich, R. Aßmann, H. Braun, Nuria Catalán Lasheras, Florian Christie, Richard D’Arcy, R. Fortunati, R. Ganter, Pau González Caminal, Martin Hoffmann, M. Huening, S. Jaster-Merz, R. Jonas, F. Marcellini, Daniel Marx, Gerard McMonagle, Jens Osterhoff, M. Pedrozzi, E. Prat Costa, S. Reiche, Matthias Reukauff, S. Schreiber, G. Tews, Mathias Vogt, S. Wesch, Walter Wuensch
Abstract
The PolariX TDS (Polarizable X-Band Transverse Deflection Structure) is an innovative TDS-design operating in the X-band frequency-range. The design gives full control of the streaking plane, which can be tuned in order to characterize the projections of the beam distribution onto arbitrary transverse axes. This novel feature opens up new opportunities for detailed characterization of the electron beam. In this paper we present first measurements of the Polarix TDS at the FLASHForward beamline at DESY, including three-dimensional reconstruction of the charge-density distribution of the bunch and slice emittance measurements in both transverse directions. The experimental results open the path toward novel and more extensive beam characterization in the direction of multi-dimensional-beam-phase-space reconstruction.