Towards Zero Defect Manufacturing paradigm: A review of the state-of-the-art methods and open challenges
Bianca Caiazzo, Mario Di Nardo, Teresa Murino, Alberto Petrillo, Gianluca Piccirillo, Stefania Santini
Topics & Concepts
Leverage (statistics)Computer scienceData scienceCloud computingBig dataField (mathematics)Industry 4.0Emerging technologiesQuality (philosophy)Risk analysis (engineering)Management scienceEngineeringArtificial intelligenceData miningBusinessPure mathematicsEpistemologyOperating systemMathematicsPhilosophyIndustrial Vision Systems and Defect DetectionManufacturing Process and OptimizationDigital Transformation in Industry