Self-Supervised Learning for Industrial Image Anomaly Detection by Simulating Anomalous Samples
Mingjing Pei, Ningzhong Liu, Bing Zhao, Han Sun
Abstract
Abstract Industrial image anomaly detection (AD) is a critical issue that has been investigated in different research areas. Many works have attempted to detect anomalies by simulating anomalous samples. However, how to simulate abnormal samples remains a significant challenge. In this study, a method for simulating anomalous samples is designed. First, for the object category, patch extraction and patch paste are designed to ensure that the extracted image patches come from the objects and are pasted to the objects in the image. Second, based on the statistical analysis of various anomalies’ presence, a combination of data augmentation is proposed to cover various anomalies as much as possible. The method is evaluated on MVTec AD and BTAD datasets; the experimental results demonstrate that our method achieves an overall detection AUC of 97.6% in MVTec AD datasets, outperforming the baseline by 1.5%, and the improvement over VT-ADL method is 4.3% on the BTAD datasets, demonstrating our method’s effectiveness and generalization.