Litcius/Paper detail

TrueDeep: A systematic approach of crack detection with less data

Ram Krishna Pandey, Akshit Achara

2023Expert Systems with Applications12 citationsDOI

Topics & Concepts

Computer scienceBenchmark (surveying)Baseline (sea)Artificial intelligenceSegmentationMachine learningAnnotationIntersection (aeronautics)Matching (statistics)Test dataF1 scoreDomain knowledgePattern recognition (psychology)Data miningStatisticsEngineeringAerospace engineeringGeographyProgramming languageGeologyOceanographyGeodesyMathematicsInfrastructure Maintenance and MonitoringNon-Destructive Testing TechniquesConcrete Corrosion and Durability
TrueDeep: A systematic approach of crack detection with less data | Litcius