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Improving CdSeTe Devices With a Back Buffer Layer of Cu<sub>x</sub>AlO<sub>y</sub>

Manoj K. Jamarkattel, Adam B. Phillips, Kamala Khanal Subedi, Ebin Bastola, Jacob M. Gibbs, Jared D. Friedl, Suman Rijal, Dipendra Pokhrel, Rasha A. Awni, Deng‐Bing Li, John Farrell, Robert F. Klie, Xavier Mathew, Yanfa Yan, Randy J. Ellingson, Michael J. Heben

2021IEEE Journal of Photovoltaics11 citationsDOI

Abstract

The open-circuit voltage ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oc</sub> ) of CdTe-based photovoltaics may be limited by carrier recombination at interfaces (front or back) or in the absorber layer. Reduction in recombination of a given dominant mechanisms can lead to improved device performance if the remaining mechanisms turn <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</small> in a narrow bias range just below the open circuit voltage. In this article, we demonstrate enhanced performance by incorporating solution-processed Cu <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</sub> AlO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">y</sub> to form a back-buffer layer in CdSe/CdTe devices. Outstanding minority carrier lifetimes of 656 and 4.2 ns were measured with glass side and film side illumination for device stacks processed with Cu <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</sub> AlO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">y</sub> . Devices demonstrated efficiencies of up to 17.4% with <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oc</sub> of 859 mV, FF of 75.6% and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">J</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">sc</sub> of 26.9 mAcm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">−2</sup> while the efficiency of the reference device without the back-buffer layer was 16.5% with <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oc</sub> of 839 mV, FF of 70.6%, and <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">J</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">sc</sub> of 27.9 mAcm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">−2</sup> .

Topics & Concepts

PhysicsTopology (electrical circuits)Computer scienceMaterials scienceElectrical engineeringEngineeringChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesCopper-based nanomaterials and applications
Improving CdSeTe Devices With a Back Buffer Layer of Cu<sub>x</sub>AlO<sub>y</sub> | Litcius