System-independent material classification through X-ray attenuation decomposition from spectral X-ray CT
Doniyor Jumanazarov, Jakeoung Koo, Matteo Busi, Henning Friis Poulsen, Ulrik L. Olsen, M. Iovea
Topics & Concepts
AttenuationEffective atomic numberDetectorBinEnergy (signal processing)Attenuation coefficientScannerRange (aeronautics)PhysicsOpticsPhotonX-ray detectorComputer scienceAlgorithmComputational physicsMaterials scienceMathematicsStatisticsComposite materialAdvanced X-ray and CT ImagingRadiation Dose and ImagingMedical Imaging Techniques and Applications