Optical measure of disorder: Why Urbach analysis works for amorphous silicon but fails for amorphous carbon
D. V. Tsu, Thomas Schuelke, John Slagter
Topics & Concepts
Raman spectroscopyBand gapAmorphous solidCondensed matter physicsMaterials scienceMeasure (data warehouse)OpticsMolecular physicsAmplitudePhysicsComputational physicsChemistryCrystallographyComputer scienceDatabaseDiamond and Carbon-based Materials ResearchHigh-pressure geophysics and materialsThin-Film Transistor Technologies