Predicting the power module cumulative damage degree in new energy vehicle: Improved Manson model
Ling-Ling Li, Zhi-Feng Liu, Ming‐Lang Tseng, Xinbao Zhang, Kuo‐Jui Wu
Topics & Concepts
Insulated-gate bipolar transistorReliability (semiconductor)DrivetrainAutomotive engineeringElectric vehiclePower (physics)Reliability engineeringJunction temperatureComputer scienceVoltageElectrical engineeringEngineeringTorquePhysicsQuantum mechanicsThermodynamicsSilicon Carbide Semiconductor TechnologiesHigh voltage insulation and dielectric phenomenaMechanical stress and fatigue analysis