Data-driven predictive model of reliability estimation using degradation models: a review
Farhad Balali, Hamid Seifoddini, Adel Nasiri
Topics & Concepts
Reliability (semiconductor)Reliability engineeringComputer scienceDegradation (telecommunications)EstimationAsset (computer security)EngineeringTelecommunicationsSystems engineeringComputer securityQuantum mechanicsPhysicsPower (physics)Reliability and Maintenance OptimizationSoftware Reliability and Analysis ResearchAdvanced Battery Technologies Research