Litcius/Paper detail

Microstructure, chemical composition, and dielectric response of CaCu3Ti4O12 ceramics doped with F, Al, and Mg ions

O. Z. Yanchevskiĭ, O. I. V’yunov, Tetiana Plutenko, А. Г. Белоус, V. V. Trachevskii, Iva Matolı́nová, Kateřina Veltruská, Viacheslav Kalinovych, Yevheniia Lobko

2023Heliyon12 citationsDOIOpen Access PDF

Abstract

Ceramics with nominal chemical composition CaCu 3 Ti 4 O 12 (CCTO), CaCu 3 Ti 3.96 Al 0.04 O 11.96 F 0.04 (CCTOAF), and Ca 0.98 Mg 0.08 Cu 2.94 Ti 3.96 Al 0.04 O 11.96 F 0.04 (CCTOMAF) were prepared by the solid-state reactions technique. Using SEM, EDX, XPS, EPR, NMR, and complex impedance spectroscopy, the microstructure, elements distribution, chemical composition of grains and grain boundaries, and the dielectric response of ceramics were investigated. In the ССТО, CCTOAF, and CCTOMAF series, the average grain size increases, the degree of copper segregation at the grain boundaries is inversely related to grain size, and the dielectric loss decreases from 0.071 to 0.047 and 0.030, respectively, while dielectric permittivity ε′ at 1 kHz is 5.6 × 10 4 , 7.1 × 10 4 , and 4.3 × 10 4 , respectively. Additives of Al, Mg, F and milled particles (ZrO 2 , Al 2 O 3 , and SiO 2 ) can either partially introduce into the perovskite structure or form low-melting eutectics at the grain boundaries, causing abnormal grain growth. The presence of copper ions in various oxidation states, as well as evidence of exchange spin interactions between them, was confirmed in all samples.

Topics & Concepts

Materials scienceMicrostructureX-ray photoelectron spectroscopyGrain boundaryDielectricCeramicGrain sizeEutectic systemAnalytical Chemistry (journal)CopperPerovskite (structure)MineralogyChemical engineeringMetallurgyChemistryChromatographyOptoelectronicsEngineeringDielectric properties of ceramicsFerroelectric and Piezoelectric Materials