Structural analysis of sputtered amorphous silica thin films: A Raman spectroscopy investigation
S. Ben Khemis, Ekaterina Burov, Hervé Montigaud, D. Skrelic, Emmanuelle Gouillart, Laurent Cormier
Topics & Concepts
Raman spectroscopyMaterials scienceAmorphous solidThin filmSubstrate (aquarium)Layer (electronics)Soda-lime glassDelamination (geology)Composite materialMineralogyOpticsNanotechnologyChemistryCrystallographyGeologyTectonicsSubductionPaleontologyOceanographyPhysicsGlass properties and applicationsMaterial Dynamics and PropertiesLuminescence Properties of Advanced Materials