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Analysis of dominant and intense XRD peak of (111) plane of ZnS nanocrystals for microstructural study through single line Voigt method: Calculated low dislocation density value emphasizes larger stacking of (111) plane

Sanghita Basak, Debojyoti Nath, Ratan Das

2023Journal of Molecular Structure28 citationsDOI

Topics & Concepts

CrystalliteNanocrystalDislocationChemistryNanoparticleNanocrystalline materialCrystallographyParticle sizeZinc nitrateAnalytical Chemistry (journal)MineralogyMaterials scienceNanotechnologyZincPhysical chemistryChromatographyOrganic chemistryQuantum Dots Synthesis And PropertiesChalcogenide Semiconductor Thin FilmsCopper-based nanomaterials and applications
Analysis of dominant and intense XRD peak of (111) plane of ZnS nanocrystals for microstructural study through single line Voigt method: Calculated low dislocation density value emphasizes larger stacking of (111) plane | Litcius