Litcius/Paper detail

Analysis of the Planar Point Identification Accuracy in CMM Measurements

Tomasz Mazur, Lenka Čepová, Tomasz Szymański, Mirosław Rucki

2022Sensors13 citationsDOIOpen Access PDF

Abstract

The paper presents the results of the investigations on the direction-dependent accuracy of the point identification during contact probe measurements with a coordinate measuring machine (CMM). Considering the contact point identified by an orthogonal to the surface probe movement, the transformation of coordinates was made in order to calculate the displacement of the measured point. As a result, the positioning accuracy was estimated in three axes. The experiments demonstrated a strong dependence of the displacement on the declination angle. Moreover, it was found that the directional surface texture which provided different roughness in perpendicular directions, had an impact on the positioning accuracy.

Topics & Concepts

Displacement (psychology)Point (geometry)Coordinate-measuring machinePerpendicularPlanarAccuracy and precisionSurface finishTransformation (genetics)Coordinate systemOpticsSurface (topology)Precise Point PositioningOrthogonal coordinatesAcousticsComputer scienceGeodesyComputer visionGeometryPhysicsMathematicsEngineeringGeologyMechanical engineeringGlobal Positioning SystemComputer graphics (images)GeneQuantum mechanicsTelecommunicationsPsychotherapistChemistryBiochemistryGNSS applicationsPsychologyAdvanced Measurement and Metrology TechniquesSurface Roughness and Optical MeasurementsOptical measurement and interference techniques