EEG Artifact Removal by Bayesian Deep Learning & ICA
Sangmin S. Lee, Kiwon Lee, Guiyeom Kang
Abstract
Artifact removal is important for EEG signal processing because artifacts adversely affect analysis results. To preserve normal EEG signal, several methods based on independent component analysis (ICA) have been studied and artifacts are removed by discarding independent components (ICs) classified as artifacts. In this study, a method using Bayesian deep learning and attention module is presented to improve performance of the classifier for ICs. Probability value is computed through the method to predict if a component is artifact and to treat ambiguous inputs. The attention module achieves increasing classification accuracy and shows the map of the region where the classifier concentrates on.
Topics & Concepts
Independent component analysisArtifact (error)Artificial intelligenceComputer scienceElectroencephalographyPattern recognition (psychology)Classifier (UML)Bayesian probabilitySignal processingSpeech recognitionDigital signal processingComputer hardwarePsychiatryPsychologyBlind Source Separation TechniquesEEG and Brain-Computer InterfacesNeural Networks and Applications