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34.9 A Flash-SRAM-ADC-Fused Plastic Computing-in-Memory Macro for Learning in Neural Networks in a Standard 14nm FinFET Process

Linfang Wang, Weizeng Li, Zhidao Zhou, Hanghang Gao, Zhi Li, Wang Ye, Hongyang Hu, Jing Liu, Jinshan Yue, Jianguo Yang, Qing Luo, Chunmeng Dou, Qi Liu, Ming Liu

202421 citationsDOI

Abstract

AI edge devices are not only required to perform inference tasks with low power and high real-time performance but are also expected to have the capability to learn and adapt to dynamic and unpredictable environments, without heavily relying on cloud-based training. The recent rise of computing-in-memory (CIM) has offered a competent solution by minimizing the power and latency associated with data movement. While many existing CIM designs [1–6] have primarily focused on improving the performance of AI inference, those with learning abilities have, so far, been relatively less studied.

Topics & Concepts

Static random-access memoryMacroComputer scienceArtificial neural networkFlash (photography)Process (computing)Flash memoryArtificial intelligenceElectronic engineeringEmbedded systemComputer hardwareEngineeringPhysicsOperating systemProgramming languageOpticsAdvanced Memory and Neural ComputingFerroelectric and Negative Capacitance DevicesFuel Cells and Related Materials
34.9 A Flash-SRAM-ADC-Fused Plastic Computing-in-Memory Macro for Learning in Neural Networks in a Standard 14nm FinFET Process | Litcius