A marker-less assembly stage recognition method based on segmented projection contour
Jiazhen Pang, Jie Zhang, Yuan Li, Wei Sun
Topics & Concepts
CADArtificial intelligenceHausdorff distanceComputer scienceComputer visionTransformation (genetics)Projection (relational algebra)Process (computing)Vertex (graph theory)Pattern recognition (psychology)Matching (statistics)Enhanced Data Rates for GSM EvolutionStage (stratigraphy)AlgorithmEngineering drawingMathematicsEngineeringOperating systemGeneBiologyBiochemistryStatisticsGraphPaleontologyChemistryTheoretical computer scienceManufacturing Process and Optimization3D Shape Modeling and AnalysisIndustrial Vision Systems and Defect Detection