A reliability evaluation method for electromagnetic relays based on a novel degradation-threshold-shock model with two-sided failure thresholds
Shihu Xiang, Changdong Zhao, Songhua Hao, Kui Li, Wenhua Li
Topics & Concepts
Reliability (semiconductor)Reliability engineeringMonte Carlo methodLimit (mathematics)Computer scienceDegradation (telecommunications)Moment (physics)Mathematical optimizationMathematicsEngineeringStatisticsPower (physics)Classical mechanicsTelecommunicationsPhysicsQuantum mechanicsMathematical analysisReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering Design