Atomic-resolution structure imaging of defects and interfaces in compound semiconductors

David J. Smith

2020Progress in Crystal Growth and Characterization of Materials28 citationsDOI

Topics & Concepts

Compound semiconductorHeterojunctionStackingSemiconductorMaterials scienceTransmission electron microscopyNanotechnologyCrystallographic defectThin filmHigh resolutionResolution (logic)Scanning transmission electron microscopyOptoelectronicsCrystallographyChemistryComputer scienceLayer (electronics)EpitaxyOrganic chemistryGeologyRemote sensingArtificial intelligenceAdvanced Electron Microscopy Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure AnalysisElectron and X-Ray Spectroscopy Techniques