Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges
Hans Vanrompay, Alexander Skorikov, Eva Bladt, Armand Béché, Bert Freitag, Johan Verbeeck, Sara Bals
Topics & Concepts
Electron tomographyTilt (camera)TomographyMaterials scienceData acquisitionResolution (logic)Computer scienceProjection (relational algebra)Tomographic reconstructionScanning transmission electron microscopyNanotechnologyOpticsArtificial intelligenceAlgorithmPhysicsTransmission electron microscopyMechanical engineeringEngineeringOperating systemAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure Analysis