Improved silicon optical parameters at 25°C, 295 K and 300 K including temperature coefficients
Martin A. Green
Abstract
Abstract Although the author's earlier tabulations of silicon's refractive index and absorption coefficient over a wide range of wavelengths have found wide use, recent luminescent measurements have shown that refinement is needed at wavelengths beyond 1200 nm. An updated dataset is described for lightly doped silicon tabulated over the 250‐ to 1450‐nm range in 10‐nm increments at three temperatures, 25°C, 295 K and 300 K, incorporating the most recent experimental results. Temperature coefficients are also included allowing reasonably accurate estimates of optical parameters over the much broader −24°C to 200°C range.
Topics & Concepts
SiliconRefractive indexMaterials scienceWavelengthRange (aeronautics)Attenuation coefficientAtmospheric temperature rangeLuminescenceAbsorption (acoustics)OpticsDopingAnalytical Chemistry (journal)OptoelectronicsThermodynamicsChemistryPhysicsComposite materialChromatographyThin-Film Transistor TechnologiesSilicon and Solar Cell TechnologiesSilicon Nanostructures and Photoluminescence