Machine learning analysis to classify nanoparticles from noisy spICP-TOFMS data
Raven L. Buckman Johnson, Alexander Gundlach‐Graham
Abstract
A two-stage semi-supervised machine learning approach was developed as a robust method to classify cerium-rich engineered, incidental, and natural nanoparticles measured by spICP-TOFMS.
Topics & Concepts
NanoparticleArtificial intelligenceCeriumComputer sciencePattern recognition (psychology)Materials scienceBiological systemNanotechnologyMetallurgyBiologyMachine Learning in Materials ScienceElectrochemical Analysis and ApplicationsGeochemistry and Geologic Mapping