X-ray characterization of anisotropic defect formation in SiC under irradiation with applied stress
Takaaki Koyanagi, David Sprouster, Lance L. Snead, Yutai Katoh
Topics & Concepts
Materials scienceNucleationIrradiationSilicon carbideStress (linguistics)CrystalliteCreepCrystallographyComposite materialUltimate tensile strengthNeutron diffractionStackingCrystal structureNuclear magnetic resonanceMetallurgyLinguisticsPhilosophyNuclear physicsOrganic chemistryChemistryPhysicsAdvanced ceramic materials synthesisSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devices