Litcius/Paper detail

Machine vision system for quality inspection of beans

Peterson Adriano Belan, Robson Aparecido Gomes de Macedo, Wonder Alexandre Luz Alves, José Carlos Curvelo Santana, Sidnei Alves de Araújo

2020The International Journal of Advanced Manufacturing Technology20 citationsDOI

Topics & Concepts

Visual inspectionRobustness (evolution)SegmentationArtificial intelligenceMachine visionAutomated X-ray inspectionSoftwarePixelProcess (computing)Computer scienceAutomationComputer visionConveyor beltImage processingPattern recognition (psychology)EngineeringImage (mathematics)BiochemistryChemistryGeneOperating systemProgramming languageMechanical engineeringIndustrial Vision Systems and Defect DetectionSmart Agriculture and AISpectroscopy and Chemometric Analyses
Machine vision system for quality inspection of beans | Litcius