Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network
Francisco López de la Rosa, José L. Gómez-Sirvent, Roberto Sánchez-Reolid, Rafael Morales, Antonio Fernández‐Caballero
Topics & Concepts
Convolutional neural networkComputer scienceTransformation (genetics)Artificial intelligencePattern recognition (psychology)Geometric transformationTransformation geometryArtificial neural networkDeep learningImage (mathematics)Machine learningChemistryBiochemistryGeneIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisImage Processing Techniques and Applications