A two-step phase-shifting algorithm dedicated to fringe projection profilometry
Yongkai Yin, Jiaqi Mao, Xiangfeng Meng, Xiulun Yang, Ke Wu, Jiangtao Xi, Baoqing Sun
Topics & Concepts
ProfilometerStructured-light 3D scannerComputer sciencePhase (matter)Projection (relational algebra)Phase retrievalAlgorithmProcess (computing)OpticsAbsolute phaseProjection methodArtificial intelligenceDykstra's projection algorithmMaterials scienceMathematicsSurface finishPhysicsScannerOperating systemQuantum mechanicsFourier transformMathematical analysisComposite materialOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesImage Processing Techniques and Applications