TEM cell for Testing Low-profile Integrated Circuits for EMC
Alexander V. Demakov, Maxim E. Komnatnov
Abstract
The paper presents the results of development of TEM cell with a working volume of $30\times 30\times 5 mm^{3}$ for measuring radiated immunity and electromagnetic emissions of low-profile integrated circuits. A solid model of the TEM cell was developed based on the analysis of various designs for matching transitions using analytical estimation and electrodynamic simulation. A research prototype of the cell was built and its S-parameters measurements were performed.
Topics & Concepts
Electromagnetic compatibilityElectronic circuitElectronic engineeringElectromagnetic simulationIntegrated circuitMatching (statistics)Electromagnetic interferenceComputer scienceMaterials scienceEngineeringElectrical engineeringMathematicsStatisticsElectromagnetic Compatibility and MeasurementsElectromagnetic Compatibility and Noise SuppressionMicrowave and Dielectric Measurement Techniques