Intensive comparative study using X-Ray diffraction for investigating microstructural parameters and crystal defects of the novel nanostructural ZnGa2S4 thin films
Alaa A. Akl, I.M. El Radaf, Ahmed Saeed Hassanien
Topics & Concepts
Materials scienceCrystalliteDiffractionTetragonal crystal systemThin filmCrystallizationCrystal (programming language)CrystallographyScanning electron microscopeMicrostructureComposite materialOpticsCrystal structureNanotechnologyChemical engineeringMetallurgyChemistryEngineeringComputer scienceProgramming languagePhysicsX-ray Diffraction in CrystallographyCopper-based nanomaterials and applicationsZnO doping and properties