Optical characterization of Sb2S3 vacuum annealed films by UV–VIS–NIR spectroscopy and spectroscopic ellipsometry: Determining the refractive index and the optical constants
Emna Gnenna, N. Khémiri, M. I. Alonso, M. Kanzari
Topics & Concepts
Refractive indexMaterials scienceMolar absorptivityAnalytical Chemistry (journal)EllipsometryAmorphous solidSpectroscopyThin filmDielectricBand gapAnnealing (glass)CrystalliteAttenuation coefficientVacuum evaporationVacuum depositionOpticsOptoelectronicsChemistryCrystallographyPhysicsNanotechnologyChromatographyMetallurgyQuantum mechanicsComposite materialChalcogenide Semiconductor Thin FilmsPhase-change materials and chalcogenidesQuantum Dots Synthesis And Properties