Highly frequency-, temperature-, and bias-stable dielectric properties of 500 °C processed Bi2SiO5 thin films with low dielectric loss
Yifu Ke, Wenhua Huang, Santhosh Kumar Thatikonda, Ruqi Chen, Chuangye Yao, Ni Qin, Dinghua Bao
Topics & Concepts
DielectricMaterials scienceThin filmDielectric lossAnnealing (glass)CapacitorDielectric spectroscopyAnalytical Chemistry (journal)Composite materialOptoelectronicsNanotechnologyElectrical engineeringChemistryVoltageElectrodePhysical chemistryElectrochemistryEngineeringChromatographyFerroelectric and Piezoelectric MaterialsDielectric properties of ceramicsMicrowave Dielectric Ceramics Synthesis