Atomic scale study of black phosphorus degradation
Changbae Hyun, Jong Hun Kim, Jong‐Young Lee, Gwan‐Hyoung Lee, Kwang S. Kim
Abstract
a conductive tip. After the voltage-assisted BP etching, the BP etching product shows crystalline BP confirmed by Raman spectroscopy and atomic force microscopy. Our atomic scale study of BP will be useful for the future 2D-based electronic devices to overcome conventional silicon-based electronic devices.
Topics & Concepts
Etching (microfabrication)Raman spectroscopyMaterials scienceMonolayerBlack phosphorusDegradation (telecommunications)NanotechnologySiliconOptoelectronicsConductive atomic force microscopyAtomic force microscopyAnalytical Chemistry (journal)ChemistryLayer (electronics)Electronic engineeringOpticsEnvironmental chemistryEngineeringPhysics2D Materials and ApplicationsMXene and MAX Phase MaterialsPerovskite Materials and Applications