An antagonistic training algorithm for TFT-LCD module mura defect detection
Guimin Lin, Lingfeng Kong, Tianjian Liu, Lida Qiu, Xiyao Chen
Topics & Concepts
MuraArtificial intelligenceComputer scienceChannel (broadcasting)Feature (linguistics)Object (grammar)DetectorDeep learningConvolutional neural networkArtificial neural networkPattern recognition (psychology)Liquid-crystal displayComputer visionObject detectionTelecommunicationsPhilosophyComputer networkOperating systemLinguisticsIndustrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsCurrency Recognition and Detection