A new graph-based semi-supervised method for surface defect classification
Yucheng Wang, Liang Gao, Yiping Gao, Xinyu Li
Topics & Concepts
GraphWeightingComputer scienceArtificial intelligencePattern recognition (psychology)ComputationConvolution (computer science)Semi-supervised learningAlgorithmArtificial neural networkTheoretical computer scienceMedicineRadiologyIndustrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsSurface Roughness and Optical Measurements